MAP Swept Wavelength Test System
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MAP Swept Wavelength Test System

Test solution for manufacturing and new device development of passive DWDM devices, ROADMs & Circuit Packs. Provides full characterization of wavelength dependence performancem

Overview

The new MAP-200 based Swept Wavelength Test System (mSWS) series represents the continued evolution of VIAVI’s industry standard solution for measuring insertion loss (IL), polarization dependent loss (PDL), return loss (RL) and directivity of DWDM devices.

It provides the optical performance required for high wavelength resolution testing in both research and development (R&D) and production environments of next-gen DWDM devices.

Currently used at more than 100 customer sites, with over 9000 detector channels deployed, the SWS test platform validates optical performance for the latest in optical components and modules including: ROADMs, Wavelength Switches, Tunable Filters and Circuit Packs. The SWS system consists of a tunable laser source, a source optics module (SOM), a control module, a receiver chassis, one or more detector modules and application software

Benefits

  • Increases manufacturing throughput without sacrificing performance – at twice the speed: mSWS enables full characterization of a high port-count CDC ROADM and does so twice as fast as competing solutions, while maintaining specifications at maximum sweep speed.
  • Reduces the test station footprint by 50 percent and minimizes overhead OpEx: mSWS doubles the number of power meters in each test module.
  • Minimizes the CapEx required to add test stations with with the industry’s most cost-effective solution: the mSWS helps quickly scale manufacturing with up to eight test stations that can be supported by one distributed tunable laser transmitter.…

Applications

  • Optical component and module characterization in manufacturing, product development & research environments
  • ROADMs,Wavelength Switches, Wavelength Blockers
  • Circuit Packs
  • Dense wavelength division multiplexing (DWDM), Coarse wavelength division multiplexing (CWDM)
  • Tunable Filters, Couplers, Splitters, Switches, Attenuators, Fiber Bragg Gratings (FBGs), Interleavers, Dichroic Filters
  • Micro-Electro-Mechanical Systems (MEMS) and Waveguide Devices

Key Features

  • Scalable architecture – add up to an additional 7 measurement stations for a total of 8 supportable from one TLS/ SOM transmitter station
  • ± 0.002 nm absolute wavelength accuracy
  • Up to 256 detector channels available per station
  • High speed scanning (user controllable) up to 40 nm/s
  • Flexible easy-to-use software & Customized applications through dynamic link libraries (DLLs)

Safety Information

Complies to CE requirements plus UL3101.1 and CAN/CSA - C22.2 No. 1010.1. The laser source in the Source Optics Module (SWS20010) is a class 1. The Tunable Laser Source (SWS17101 and SWS18101) is a class 3B laser. Both are classified per IEC standard 60825-1(202) and comply with 21CFR1040.10 except deviations per Laser Notice No. 50, July 2001.