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Multiple Application Platform (MAP)
Optical test and measurement platform optimized for cost-effective development and manufacturing of optical transmission network elements.
Provides a flexible, more cost-effective compact platform for optical test switching and signal conditioning in optical device and sub-system development and manufacturing.
Test solution for manufacturing and new device development of passive DWDM devices, ROADMs & Circuit Packs. Provides full characterization of wavelength dependence performancem
The MAP-200 Erbium Doped Fiber Amplifiers (mEDFA-C1) meet some of the most demanding optical specifications including a low-noise version with <3.7dB noise figure. DWDM, high power and an L-band version are also available.
Panel mount or remote head configurations with densities up to 4 per module.
MAP-200 Tunable Distributed Bragg Reflector (DBR) laser (mTLG-C1) is a new-generation tunable laser that is ideal for DWDM testing where the capability to change wavelength on demand over the C- band with 50 GHz spacing is essential.
The MAP-200 Broadband Source (mBBS-C1) provides an amplified spontaneous emission (ASE) output that is ultra-stable, spectrally flattened and high-power density across the extended C-band.
Optical Switch Solutions built on the industry-leading, fourth-generation instrumentation class of Viavi optical switch technology.
High-resolution, wide wavelength-range attenuator ideal for use in applications such as analog systems and high bit-rate digital systems.
Singlemode Insertion Loss / Return Loss test meter and fully EF-compliant multimode Insertion Loss test modules for use with the ViaviM advanced MAP-200 platform.
The MAP-200 Polarization Control Module (mPCX-C1) provides polarization scrambling, control and stabilization for use in applications such as temporal depolarization, 100G+ coherent interface testing as well as stabilization and tracking of target SOP conditions
The MAP-200 Utility Module, mUTL-C1, provides a range of passive optical devices such as couplers, splitters, Mux/Demux modules and band-pass filters to simplify the integration of these devices into automated test systems