From the original Multiple Application Platform (MAP) System released in 2001 to the new MAP-300 Series, the MAP system is the heart of the VIAVI test solution. With unmatched scalability, users can be assured that their test solutions will meet their exact needs, while still giving them the ability to address future requirements as they arise.
Third Generation optical test and measurement system that is optimized for compact cost-effective development and manufacturing of optical communications technology.
Provides a flexible, more cost-effective compact platform for optical test switching and signal conditioning in optical device and sub-system development and manufacturing.
Optical test and measurement platform optimized for cost-effective development and manufacturing of optical transmission network elements.