AXRF-Q RF Sub-System for Semiconductor Test (Discontinued)

AXRF-Q is a Multi-Port RF Subsystem for testing RF semi-conductor components.

AXRF-Q RF Sub-System For Semiconductor Test

Features

  • Up to 32 bi-directional RF Test Ports
  • Scalar & Vector Network Analysis
  • Gain and Noise Figure measurement
  • Wide Bandwidth Modulated Signal Generation and Analysis to 6 GHz
  • Radio Communication Standards Personality Options
  • Modular open architecture based on PXI/PXIe

 

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